Global Metrology,Inspection,and Process Control in VLSI Market Size, Status and Forecast 2019-2025

1 Report Overview

• 1.1 Study Scope
• 1.2 Key Market Segments
• 1.3 Players Covered: Ranking by Metrology,Inspection,and Process Control in VLSI Revenue
• 1.4 Market by Type
  • 1.4.1 Global Metrology,Inspection,and Process Control in VLSI Market Size Growth Rate by Type: 2020 VS 2026
  • 1.4.2 Metrology/Inspection Technologies
  • 1.4.3 Defect Review/Wafer Inspection
  • 1.4.4 Thin Film Metrology
  • 1.4.5 Lithography Metrology
• 1.5 Market by Application
  • 1.5.1 Global Metrology,Inspection,and Process Control in VLSI Market Share by Application: 2020 VS 2026
  • 1.5.2 Total Process Control
  • 1.5.3 Lithography Metrology
  • 1.5.4 Wafer Inspection / Defect
  • 1.5.5 Thin Film Metrology
  • 1.5.6 Others
• 1.6 Study Objectives
• 1.7 Years Considered

2 Global Growth Trends

• 2.1 Global Metrology,Inspection,and Process Control in VLSI Market Perspective (2015-2026)
• 2.2 Global Metrology,Inspection,and Process Control in VLSI Growth Trends by Regions
  • 2.2.1 Metrology,Inspection,and Process Control in VLSI Market Size by Regions: 2015 VS 2020 VS 2026
  • 2.2.2 Metrology,Inspection,and Process Control in VLSI Historic Market Share by Regions (2015-2020)
  • 2.2.3 Metrology,Inspection,and Process Control in VLSI Forecasted Market Size by Regions (2021-2026)
• 2.3 Industry Trends and Growth Strategy
  • 2.3.1 Market Top Trends
  • 2.3.2 Market Drivers
  • 2.3.3 Market Challenges
  • 2.3.4 Porter’s Five Forces Analysis
  • 2.3.5 Metrology,Inspection,and Process Control in VLSI Market Growth Strategy
  • 2.3.6 Primary Interviews with Key Metrology,Inspection,and Process Control in VLSI Players (Opinion Leaders)

3 Competition Landscape by Key Players

• 3.1 Global Top Metrology,Inspection,and Process Control in VLSI Players by Market Size
  • 3.1.1 Global Top Metrology,Inspection,and Process Control in VLSI Players by Revenue (2015-2020)
  • 3.1.2 Global Metrology,Inspection,and Process Control in VLSI Revenue Market Share by Players (2015-2020)
  • 3.1.3 Global Metrology,Inspection,and Process Control in VLSI Market Share by Company Type (Tier 1, Tier 2 and Tier 3)
• 3.2 Global Metrology,Inspection,and Process Control in VLSI Market Concentration Ratio
  • 3.2.1 Global Metrology,Inspection,and Process Control in VLSI Market Concentration Ratio (CR5 and HHI)
  • 3.2.2 Global Top 10 and Top 5 Companies by Metrology,Inspection,and Process Control in VLSI Revenue in 2019
• 3.3 Metrology,Inspection,and Process Control in VLSI Key Players Head office and Area Served
• 3.4 Key Players Metrology,Inspection,and Process Control in VLSI Product Solution and Service
• 3.5 Date of Enter into Metrology,Inspection,and Process Control in VLSI Market
• 3.6 Mergers & Acquisitions, Expansion Plans

4 Market Size by Type (2015-2026)

• 4.1 Global Metrology,Inspection,and Process Control in VLSI Historic Market Size by Type (2015-2020)
• 4.2 Global Metrology,Inspection,and Process Control in VLSI Forecasted Market Size by Type (2021-2026)

5 Market Size by Application (2015-2026)

• 5.1 Global Metrology,Inspection,and Process Control in VLSI Market Size by Application (2015-2020)
• 5.2 Global Metrology,Inspection,and Process Control in VLSI Forecasted Market Size by Application (2021-2026)

6 North America

• 6.1 North America Metrology,Inspection,and Process Control in VLSI Market Size (2015-2020)
• 6.2 Metrology,Inspection,and Process Control in VLSI Key Players in North America (2019-2020)
• 6.3 North America Metrology,Inspection,and Process Control in VLSI Market Size by Type (2015-2020)
• 6.4 North America Metrology,Inspection,and Process Control in VLSI Market Size by Application (2015-2020)

7 Europe

• 7.1 Europe Metrology,Inspection,and Process Control in VLSI Market Size (2015-2020)
• 7.2 Metrology,Inspection,and Process Control in VLSI Key Players in Europe (2019-2020)
• 7.3 Europe Metrology,Inspection,and Process Control in VLSI Market Size by Type (2015-2020)
• 7.4 Europe Metrology,Inspection,and Process Control in VLSI Market Size by Application (2015-2020)

8 China

• 8.1 China Metrology,Inspection,and Process Control in VLSI Market Size (2015-2020)
• 8.2 Metrology,Inspection,and Process Control in VLSI Key Players in China (2019-2020)
• 8.3 China Metrology,Inspection,and Process Control in VLSI Market Size by Type (2015-2020)
• 8.4 China Metrology,Inspection,and Process Control in VLSI Market Size by Application (2015-2020)

9 Japan

• 9.1 Japan Metrology,Inspection,and Process Control in VLSI Market Size (2015-2020)
• 9.2 Metrology,Inspection,and Process Control in VLSI Key Players in Japan (2019-2020)
• 9.3 Japan Metrology,Inspection,and Process Control in VLSI Market Size by Type (2015-2020)
• 9.4 Japan Metrology,Inspection,and Process Control in VLSI Market Size by Application (2015-2020)

10 Southeast Asia

• 10.1 Southeast Asia Metrology,Inspection,and Process Control in VLSI Market Size (2015-2020)
• 10.2 Metrology,Inspection,and Process Control in VLSI Key Players in Southeast Asia (2019-2020)
• 10.3 Southeast Asia Metrology,Inspection,and Process Control in VLSI Market Size by Type (2015-2020)
• 10.4 Southeast Asia Metrology,Inspection,and Process Control in VLSI Market Size by Application (2015-2020)

11 India

• 11.1 India Metrology,Inspection,and Process Control in VLSI Market Size (2015-2020)
• 11.2 Metrology,Inspection,and Process Control in VLSI Key Players in India (2019-2020)
• 11.3 India Metrology,Inspection,and Process Control in VLSI Market Size by Type (2015-2020)
• 11.4 India Metrology,Inspection,and Process Control in VLSI Market Size by Application (2015-2020)

12 Central & South America

• 12.1 Central & South America Metrology,Inspection,and Process Control in VLSI Market Size (2015-2020)
• 12.2 Metrology,Inspection,and Process Control in VLSI Key Players in Central & South America (2019-2020)
• 12.3 Central & South America Metrology,Inspection,and Process Control in VLSI Market Size by Type (2015-2020)
• 12.4 Central & South America Metrology,Inspection,and Process Control in VLSI Market Size by Application (2015-2020)

13 Key Players Profiles

• 13.1 Applied Materials
  • 13.1.1 Applied Materials Company Details
  • 13.1.2 Applied Materials Business Overview
  • 13.1.3 Applied Materials Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.1.4 Applied Materials Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020))
  • 13.1.5 Applied Materials Recent Development
• 13.2 KLA-Tencor
  • 13.2.1 KLA-Tencor Company Details
  • 13.2.2 KLA-Tencor Business Overview
  • 13.2.3 KLA-Tencor Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.2.4 KLA-Tencor Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 13.2.5 KLA-Tencor Recent Development
• 13.3 Leica
  • 13.3.1 Leica Company Details
  • 13.3.2 Leica Business Overview
  • 13.3.3 Leica Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.3.4 Leica Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 13.3.5 Leica Recent Development
• 13.4 JEOL
  • 13.4.1 JEOL Company Details
  • 13.4.2 JEOL Business Overview
  • 13.4.3 JEOL Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.4.4 JEOL Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 13.4.5 JEOL Recent Development
• 13.5 Hitachi
  • 13.5.1 Hitachi Company Details
  • 13.5.2 Hitachi Business Overview
  • 13.5.3 Hitachi Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.5.4 Hitachi Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 13.5.5 Hitachi Recent Development
• 13.6 Carl Zeiss Microelectronic Systems
  • 13.6.1 Carl Zeiss Microelectronic Systems Company Details
  • 13.6.2 Carl Zeiss Microelectronic Systems Business Overview
  • 13.6.3 Carl Zeiss Microelectronic Systems Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.6.4 Carl Zeiss Microelectronic Systems Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 13.6.5 Carl Zeiss Microelectronic Systems Recent Development
• 13.7 Nanometrics
  • 13.7.1 Nanometrics Company Details
  • 13.7.2 Nanometrics Business Overview
  • 13.7.3 Nanometrics Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.7.4 Nanometrics Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 13.7.5 Nanometrics Recent Development
• 13.8 Physical Electronics
  • 13.8.1 Physical Electronics Company Details
  • 13.8.2 Physical Electronics Business Overview
  • 13.8.3 Physical Electronics Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.8.4 Physical Electronics Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 13.8.5 Physical Electronics Recent Development
• 13.9 Schlumberger
  • 13.9.1 Schlumberger Company Details
  • 13.9.2 Schlumberger Business Overview
  • 13.9.3 Schlumberger Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.9.4 Schlumberger Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 13.9.5 Schlumberger Recent Development
• 13.10 Topcon
  • 13.10.1 Topcon Company Details
  • 13.10.2 Topcon Business Overview
  • 13.10.3 Topcon Metrology,Inspection,and Process Control in VLSI Introduction
  • 13.10.4 Topcon Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 13.10.5 Topcon Recent Development
• 13.11 Solid State Measurements
  • 10.11.1 Solid State Measurements Company Details
  • 10.11.2 Solid State Measurements Business Overview
  • 10.11.3 Solid State Measurements Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.11.4 Solid State Measurements Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.11.5 Solid State Measurements Recent Development
• 13.12 Rigaku
  • 10.12.1 Rigaku Company Details
  • 10.12.2 Rigaku Business Overview
  • 10.12.3 Rigaku Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.12.4 Rigaku Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.12.5 Rigaku Recent Development
• 13.13 Axic
  • 10.13.1 Axic Company Details
  • 10.13.2 Axic Business Overview
  • 10.13.3 Axic Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.13.4 Axic Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.13.5 Axic Recent Development
• 13.14 Jipelec
  • 10.14.1 Jipelec Company Details
  • 10.14.2 Jipelec Business Overview
  • 10.14.3 Jipelec Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.14.4 Jipelec Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.14.5 Jipelec Recent Development
• 13.15 Sentech Instruments
  • 10.15.1 Sentech Instruments Company Details
  • 10.15.2 Sentech Instruments Business Overview
  • 10.15.3 Sentech Instruments Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.15.4 Sentech Instruments Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.15.5 Sentech Instruments Recent Development
• 13.16 Secon
  • 10.16.1 Secon Company Details
  • 10.16.2 Secon Business Overview
  • 10.16.3 Secon Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.16.4 Secon Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.16.5 Secon Recent Development
• 13.17 Philips
  • 10.17.1 Philips Company Details
  • 10.17.2 Philips Business Overview
  • 10.17.3 Philips Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.17.4 Philips Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.17.5 Philips Recent Development
• 13.18 Jordan Valley Semiconductors
  • 10.18.1 Jordan Valley Semiconductors Company Details
  • 10.18.2 Jordan Valley Semiconductors Business Overview
  • 10.18.3 Jordan Valley Semiconductors Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.18.4 Jordan Valley Semiconductors Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.18.5 Jordan Valley Semiconductors Recent Development
• 13.19 KLA-Tencor
  • 10.19.1 KLA-Tencor Company Details
  • 10.19.2 KLA-Tencor Business Overview
  • 10.19.3 KLA-Tencor Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.19.4 KLA-Tencor Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.19.5 KLA-Tencor Recent Development
• 13.20 Nanometrics
  • 10.20.1 Nanometrics Company Details
  • 10.20.2 Nanometrics Business Overview
  • 10.20.3 Nanometrics Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.20.4 Nanometrics Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.20.5 Nanometrics Recent Development
• 13.21 Aquila Instruments
  • 10.21.1 Aquila Instruments Company Details
  • 10.21.2 Aquila Instruments Business Overview
  • 10.21.3 Aquila Instruments Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.21.4 Aquila Instruments Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.21.5 Aquila Instruments Recent Development
• 13.22 Leica Microsystems
  • 10.22.1 Leica Microsystems Company Details
  • 10.22.2 Leica Microsystems Business Overview
  • 10.22.3 Leica Microsystems Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.22.4 Leica Microsystems Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.22.5 Leica Microsystems Recent Development
• 13.23 PHI-Evans
  • 10.23.1 PHI-Evans Company Details
  • 10.23.2 PHI-Evans Business Overview
  • 10.23.3 PHI-Evans Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.23.4 PHI-Evans Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.23.5 PHI-Evans Recent Development
• 13.24 Thermo Nicolet
  • 10.24.1 Thermo Nicolet Company Details
  • 10.24.2 Thermo Nicolet Business Overview
  • 10.24.3 Thermo Nicolet Metrology,Inspection,and Process Control in VLSI Introduction
  • 10.24.4 Thermo Nicolet Revenue in Metrology,Inspection,and Process Control in VLSI Business (2015-2020)
  • 10.24.5 Thermo Nicolet Recent Development

14 Analyst's Viewpoints/Conclusions

15 Appendix

• 15.1 Research Methodology
  • 15.1.1 Methodology/Research Approach
  • 15.1.2 Data Source
• 15.2 Disclaimer