Summary
an ellipsometer enables to measure the refractive index and the thickness of semi-transparent thin films. The instrument relies on the fact that the reflection at a dielectric interface depends on the polarization of the light while the transmission of light through a transparent layer changes the phase of the incoming wave depending on the refractive index of the material. An ellipsometer can be used to measure layers as thin as 1 nm up to layers which are several microns thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.
Market Segment as follows:
By Type
Laser Ellipsometer
Spectroscopic Ellipsometer
By Application
Semiconductors and Electronics
Academia and Labs
Photovoltaics and Solar Cells
Others
By Company
J.A. Woollam Co.(US)
Horiba (Japan)
Gaertner Scientific Corporation (US)
Semilab (Hungary)
Sentech (Germany)
Holmarc Opto-Mechatronics (India)
Ellitop-Products (China)
Accurion (Germany)
Angstrom Sun Technologies (US)
Film Sense (US)
The main contents of the report including:
Section 1:
Product definition, type and application, global and China market overview;
Section 2:
Global and China Market competition by company;
Section 3:
Global and China sales revenue, volume and price by type;
Section 4:
Global and China sales revenue, volume and price by application;
Section 5:
China export and import;
Section 6:
Company information, business overview, sales data and product specifications;
Section 7:
Industry chain and raw materials;
Section 8:
SWOT and Porter's Five Forces;
Section 9:
Conclusion.
Summary:
Get latest Market Research Reports on Ellipsometer. Industry analysis & Market Report on Ellipsometer is a syndicated market report, published as Global and China Ellipsometer Market Research by Company, Type & Application 2013-2025. It is complete Research Study and Industry Analysis of Ellipsometer market, to understand, Market Demand, Growth, trends analysis and Factor Influencing market.