Table of Content

1 Market Overview

• 1.1 Market Segment Overview
  • 1.1.1 Product Definition
  • 1.1.2 Market by Type
    • 1.1.2.1 Laser Ellipsometer
    • 1.1.2.2 Spectroscopic Ellipsometer
  • 1.1.3 Market by Application
    • 1.1.3.1 Semiconductors and Electronics
    • 1.1.3.2 Academia and Labs
    • 1.1.3.3 Photovoltaics and Solar Cells
    • 1.1.3.4 Others
• 1.2 Global and China Market Size
  • 1.2.1 Global Overview
  • 1.2.2 China Overview

2 Global and China Market by Company

• 2.1 Global
  • 2.1.1 Global Sales by Company
  • 2.1.2 Global Price by Company
• 2.2 China
  • 2.2.1 China Sales by Company
  • 2.2.2 China Price by Company

3 Global and China Market by Type

• 3.1 Global
  • 3.1.1 Global Sales by Type
  • 3.1.2 Global Price by Type
• 3.2 China
  • 3.2.1 China Sales by Type
  • 3.2.2 China Price by Type

4 Global and China Market by Application

• 4.1 Global
  • 4.1.1 Global Sales by Application
  • 4.1.2 Global Price by Application
• 4.2 China
  • 4.2.1 China Sales by Application
  • 4.2.2 China Price by Application

5 China Trade

• 5.1 Export
• 5.2 Import

6 Key Manufacturers

• 6.1 J.A. Woollam Co.(US)
  • 6.1.1 Company Information
  • 6.1.2 Product Specifications
  • 6.1.3 Business Data (Capacity, Sales Revenue, Volume, Price, Cost and Margin)
• 6.2 Horiba (Japan)
• 6.3 Gaertner Scientific Corporation (US)
• 6.4 Semilab (Hungary)
• 6.5 Sentech (Germany)
• 6.6 Holmarc Opto-Mechatronics (India)
• 6.7 Ellitop-Products (China)
• 6.8 Accurion (Germany)
• 6.9 Angstrom Sun Technologies (US)
• 6.10 Film Sense (US)

7 Industry Upstream

• 7.1 Industry Chain
• 7.2 Raw Materials

8 Market Environment

• 8.1 SWOT
• 8.2 Porter's Five Forces

9 Conclusion

Summary
an ellipsometer enables to measure the refractive index and the thickness of semi-transparent thin films. The instrument relies on the fact that the reflection at a dielectric interface depends on the polarization of the light while the transmission of light through a transparent layer changes the phase of the incoming wave depending on the refractive index of the material. An ellipsometer can be used to measure layers as thin as 1 nm up to layers which are several microns thick. Applications include the accurate thickness measurement of thin films, the identification of materials and thin layers and the characterization of surfaces.
Market Segment as follows:
By Type
Laser Ellipsometer
Spectroscopic Ellipsometer
By Application
Semiconductors and Electronics
Academia and Labs
Photovoltaics and Solar Cells
Others
By Company
J.A. Woollam Co.(US)
Horiba (Japan)
Gaertner Scientific Corporation (US)
Semilab (Hungary)
Sentech (Germany)
Holmarc Opto-Mechatronics (India)
Ellitop-Products (China)
Accurion (Germany)
Angstrom Sun Technologies (US)
Film Sense (US)
The main contents of the report including:
Section 1:
Product definition, type and application, global and China market overview;
Section 2:
Global and China Market competition by company;
Section 3:
Global and China sales revenue, volume and price by type;
Section 4:
Global and China sales revenue, volume and price by application;
Section 5:
China export and import;
Section 6:
Company information, business overview, sales data and product specifications;
Section 7:
Industry chain and raw materials;
Section 8:
SWOT and Porter's Five Forces;
Section 9:
Conclusion.